Santa Clara, CA, United States of America

Metrologix, Inc.

Calculating rank

USPTO Granted Patents = 4

Forward Citations = 53

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6 inventors (with patents filed for the assignee):

Kevin M Monahan (3 out of 33 patents)

Guillermo L Toro-Lira (2 out of 8 patents)

Robert Zmrzli (1 out of 4 patents)

4. Philip R Rigg (1 out of 3 patents)

5. Alan H Achilles (1 out of 3 patents)

6. Nolan V Frederick (1 out of 1 patent)

4 patents: Sort by Forward Citations

1. 5493116 - Detection system for precision measurements and high resolution (1996-02-20),

2. 5332898 - Precision measurement using particle beam devices (1994-07-26),

3. 5302828 - Scanning techniques in particle beam devices for reducing the effects of (1994-04-12),

4. 5155359 - Atomic scale calibration system (1992-10-13),

Company Overview

Metrologix, Inc. is a leading provider of advanced metrology and measurement solutions for industrial applications. With a focus on precision and accuracy, we offer a wide range of cutting-edge products and services to help our customers optimize their manufacturing processes. Our team of experienced engineers and technicians are dedicated to ensuring the highest level of quality and customer satisfaction. Visit our website to learn more about how Metrologix can help your business succeed.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

4 Patents

#530 in Santa Clara, CA

#14,063 in California

#60,704 in US

Santa Clara, CA, United States of America

Metrologix, Inc.

Forward Citations = 53

6 inventors:

Kevin M Monahan (3 out of 33 patents)

Guillermo L Toro-Lira (2 out of 8 patents)

Robert Zmrzli (1 out of 4 patents)

4. Philip R Rigg (1 out of 3 patents)

5. Alan H Achilles (1 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Metrologix, Inc.. Retrieved from https://idiyas.com/company/metrologix

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]