Nolan V Frederick

Title: Innovations by Nolan V Frederick

Introduction

Nolan V Frederick is an accomplished inventor based in Boulder, CO. He has made significant contributions to the field of precision measurement and imaging technology. His innovative work has led to the development of a unique detection system that enhances the imaging of high-aspect-ratio structures.

Latest Patents

Nolan holds a patent for a detection system for precision measurements and high resolution. This patent describes improved techniques for imaging high-aspect-ratio structures, such as contact holes. The system utilizes two signal detection sub-systems, one optimized for imaging at the top and another for the base of submicrometer structures. The signals produced can be combined in real-time to create images resembling 'extended focus' images obtained with confocal optical microscopes. Unlike confocal images, the resulting image maintains the linearity and resolution characteristics of electron-beam technology. This innovative approach allows for high-precision measurement without the need for extrapolation, as the signal exhibits its maximum at the base of the structure.

Career Highlights

Nolan is currently associated with Metrologix, Inc., where he continues to push the boundaries of imaging technology. His work has garnered attention for its practical applications in various industries that require precision measurement.

Collaborations

Nolan has collaborated with notable colleagues, including Guillermo L Toro-Lira and Alan H Achilles. These partnerships have contributed to the advancement of his research and the successful implementation of his inventions.

Conclusion

Nolan V Frederick's contributions to precision measurement and imaging technology exemplify the spirit of innovation. His patented detection system represents a significant advancement in the field, showcasing his expertise and dedication to improving measurement techniques.