% Expired Patents = 33.3

CIPO Patents = 3

EPO Patents = 4

Forward Citations = 29

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5 inventors (with patents filed for the assignee):

Albert Claude Boccara (6 out of 12 patents)

Fabrice Harms (6 out of 10 patents)

Bertrand Le Conte Chrestien De Poly (3 out of 3 patents)

4. Anne Latrive (1 out of 1 patent)

5. Bertrand Le Conte De Poly (1 out of 1 patent)

6 patents: Sort by Forward Citations

1. 11543641 - Method and system for full-field interference microscopy imaging (2023-01-03),

2. 10627613 - Method and system for full-field interference microscopy imaging (2020-04-21),

3. 9255785 - Method and device for high resolution full field interference microscopy (2016-02-09),

4. 9185357 - Optical tissue sectioning using full field optical coherence tomography (2015-11-10),

5. 9046338 - Full-field optical coherence tomography system for imaging an object (2015-06-02),

6. 9025150 - Method and device for high resolution full field interference microscopy (2015-05-05),

Company Overview

Lltech Management is a leading management consulting firm that provides innovative solutions to help businesses improve efficiency and achieve their goals. Our team of experienced professionals specializes in strategic planning, organizational development, and operational optimization.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

6 Patents

#502 in Paris

#2,491 in France

Paris, France

Lltech Management

Forward Citations = 29

5 inventors:

Albert Claude Boccara (6 out of 12 patents)

Fabrice Harms (6 out of 10 patents)

Bertrand Le Conte Chrestien De Poly (3 out of 3 patents)

4. Anne Latrive (1 out of 1 patent)

5. Bertrand Le Conte De Poly (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Lltech Management. Retrieved from https://idiyas.com/company/lltech-management

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

3 patents (CIPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

4 patents (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]