The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2023

Filed:

Apr. 01, 2020
Applicant:

Lltech Management, Paris, FR;

Inventors:

Albert Claude Boccara, Paris, FR;

Fabrice Harms, Orsay, FR;

Assignee:

LLTECH MANAGEMENT, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/14 (2006.01); G02B 21/12 (2006.01); G01B 9/02091 (2022.01); G02B 21/00 (2006.01); G01N 21/47 (2006.01); G02B 21/08 (2006.01); G06T 5/50 (2006.01); G02B 21/18 (2006.01); G06T 1/00 (2006.01);
U.S. Cl.
CPC ...
G02B 21/125 (2013.01); G01B 9/02091 (2013.01); G01N 21/47 (2013.01); G01N 21/4795 (2013.01); G02B 21/0004 (2013.01); G02B 21/082 (2013.01); G02B 21/14 (2013.01); G06T 5/50 (2013.01); G01N 2021/4709 (2013.01); G02B 21/18 (2013.01); G06T 1/0007 (2013.01); G06T 2207/10101 (2013.01);
Abstract

A system that includes an interference device including a reference arm on which a reflective surface is arranged, where the interference device produces, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth; an acquisition device suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and a processing unit that calculates an image representing temporal variations in intensity between said N two-dimensional interferometric signals.


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