The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2015
Filed:
Sep. 19, 2011
Albert Claude Boccara, Paris, FR;
Fabrice Harms, Orsay, FR;
Bertrand Le Conte Chrestien DE Poly, Paris, FR;
Albert Claude Boccara, Paris, FR;
Fabrice Harms, Orsay, FR;
Bertrand Le Conte Chrestien De Poly, Paris, FR;
LLTECH MANAGEMENT, Paris, FR;
Abstract
According to a first aspect, the invention relates to a multimodal optical sectioning microscope () for full-field imaging of a volumic and scattering sample comprising: —a full-field OCT system for providing an image of a first section in depth of the sample comprising an illumination sub-system () and a full-field imaging interferometer with a detection sub system () and an optical conjugation device for optically conjugating the sample and said detection sub system, wherein said optical conjugation device comprises a microscope objective (), —a supplementary full-field optical sectioning imaging system for providing a fluorescent image of a second section in depth of said sample comprising a structured illumination microscope with an illumination sub system (), means () for generating at the focal plane of said microscope objective of said full-field imaging interferometer a variable spatial pattern illumination and a detection sub system (), optically conjugated with said focal plane of the microscope objective.