For the Inventor, By the Inventor

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Depew, NY, United States of America

Leica Microsystems Inc.

USPTO Granted Patents = 34

% Expired Patents = 17.6

EPO Patents = 1

Trademarks = 12

Forward Citations = 214

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26 inventors (with patents filed for the assignee):

David A Luce (5 out of 53 patents)

Scott W Parks (4 out of 7 patents)

Thomas E Ryan (4 out of 7 patents)

4. Werner Hoelbl (4 out of 24 patents)

5. Russell J Bonaventura (3 out of 14 patents)

6. Vincent Vaccarelli (3 out of 7 patents)

7. David J Cash (3 out of 3 patents)

8. Keshav D Sharma (3 out of 6 patents)

9. Kyle R Bleyle (3 out of 4 patents)

10. Jeffrey M Sabin (2 out of 10 patents)

11. Michael J Byrne (2 out of 4 patents)

12. Erin D Spring (2 out of 2 patents)

13. Christopher T Cotton (2 out of 24 patents)

14. Werner Holbl (2 out of 15 patents)

15. Al-Hafeez Z Dhalla (1 out of 16 patents)

Core Competencies:

Image Transformation

Optical Beam Scan

Microscope Objective

Phase Contrast

Magnetic Optical Holder

Illumination Power Supply

Anti-Theft Device

Metallurgical Sample

Non-Contact Tonometer

Refractometer

Ophthalmic Instrument

Automatic Optometer

34 patents: Sort by Forward Citations

1. 11067786 - Artifact regulation methods in deep model training for image transformation (2021-07-20),

2. 10791255 - Configurable optical beam scan drive sytems (2020-09-29),

3. 6989927 - Stage well (2006-01-24),

4. 6965356 - Microscopy laboratory system (2005-11-15),

5. 6924607 - Method and apparatus for automatically shutting off a microscope (2005-08-02),

6. 6914728 - Optical arrangement for microscope objective (2005-07-05),

7. 6900776 - Microscopy laboratory system (2005-05-31),

8. 6882481 - Optical arrangement for high power microobjective (2005-04-19),

9. 6804050 - Multiple phase contrast annulus slider (2004-10-12),

10. 6791767 - Magnetic optical element holder and microscope assembly including same (2004-09-14),

11. 6717373 - Method and apparatus for supplying power to a source of illumination in a microscope (2004-04-06),

12. 6547475 - Anti-theft securing device and microscope having removable body part anti-theft protected (2003-04-15),

13. 6526813 - Metallurgical sample magazine (2003-03-04),

14. D468430 - Hand-held non-contact tonometer (2003-01-08),

15. 6486944 - Fluid-sealed refractometer having data transmission means (2002-11-26),

Company Overview

Leica Microsystems Inc., based in Depew, NY, specializes in the development and manufacturing of high-precision optical systems and microscopy solutions. The company focuses on advanced imaging technologies that serve various sectors, including life sciences, materials science, and industrial applications. With a commitment to innovation, Leica Microsystems provides tools that enhance research and quality control processes, enabling scientists and engineers to achieve greater insights and results in their respective fields.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 13 2026

34 Patents

#2 in Depew, NY

#601 in New York

#10,014 in US

#19,631 in the World

Depew, NY, United States of America

Leica Microsystems Inc.

Forward Citations = 214

26 inventors:

David A Luce (5 out of 53 patents)

Scott W Parks (4 out of 7 patents)

Thomas E Ryan (4 out of 7 patents)

4. Werner Hoelbl (4 out of 24 patents)

5. Russell J Bonaventura (3 out of 14 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Leica Microsystems Inc.. Retrieved from https://idiyas.com/company/leica-microsystems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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