Depew, NY, United States of America

Leica Microsystems Inc.


USPTO Granted Patents = 34

% Expired Patents = 17.6


Trademarks = 12

Forward Citations = 214

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26 inventors (with patents filed for the assignee):

goldMedal David A Luce (5 out of 53 patents)

silverMedal Scott W Parks (4 out of 7 patents)

bronzeMedal Thomas E Ryan (4 out of 7 patents)

4.  Werner Hoelbl (4 out of 24 patents)

5.  Russell J Bonaventura (3 out of 14 patents)

6.  Vincent Vaccarelli (3 out of 7 patents)

7.  David J Cash (3 out of 3 patents)

8.  Keshav D Sharma (3 out of 6 patents)

9.  Kyle R Bleyle (3 out of 4 patents)

10.  Jeffrey M Sabin (2 out of 10 patents)

11.  Michael J Byrne (2 out of 4 patents)

12.  Erin D Spring (2 out of 2 patents)

13.  Christopher T Cotton (2 out of 24 patents)

14.  Werner Holbl (2 out of 15 patents)

15.  Al-Hafeez Z Dhalla (1 out of 16 patents)


34 patents:

Leica Microsystems is a leading global provider of microscopes and scientific instruments for the analysis of microstructures and nanostructures. Their high-performance solutions are used by researchers, scientists, and engineers in a wide range of industries, including healthcare, life sciences, and materials science. With a commitment to innovation and quality, Leica Microsystems is dedicated to helping customers achieve their research goals with precision and accuracy.
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USPTO Data Jan 1 1976 - Sep 29 2026

34 Patents

#2 in Depew, NY

#600 in New York

#9,991 in US

#19,594 in the World

Depew, NY (US)
Depew, NY, United States of America
Forward Citations = 214

26 inventors:

Please report any incorrect information to [email protected]
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