The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2003
Filed:
Sep. 25, 2000
Arvid A. Casler, Mundelein, IL (US);
Leica Microsystems Inc., Bannockburn, IL (US);
Abstract
An accessory device for use with a microhardness tester to position a test surface of a sample in a focal plane of the microhardness tester is disclosed. The device comprises a frame having a base that attaches to a z-stage of a microhardness tester, and upstanding front and rear walls connected by a bridge wall spaced vertically from the base. The front and rear walls of the frame each have an inwardly protruding detent rail defining an engagement surface on an underside of the detent rail, wherein the respective engagement surfaces lie in a common plane that corresponds to the focal plane of an objective lens of the microhardness tester. A swivel stage is provided between the front and rear walls for carrying a test sample. The stage is movable automatically or manually to a test position wherein a test surface of the sample abuts with the engagement surfaces in the focal plane and a released position. The frame is preferably elongated in a lateral direction to slidably support a series of samples for successive testing.