The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2005
Filed:
Dec. 05, 2002
Keshav D. Sharma, Lancaster, NY (US);
Keshav D. Sharma, Lancaster, NY (US);
Leica Microsystems Inc., Buffalo, NY (US);
Abstract
This invention relates to a microscope having an infinity-corrected objective and providing a flat field of view. The present invention is an optical arrangement that broadly comprises a first lens element having positive power and comprising at least one lens, a second lens element having negative power and comprising at least one lens, a third lens element having positive power and comprising at least one lens, a fourth lens element having positive power and comprising at least one lens, and a fifth lens element comprising at least one lens and having positive power, and, in addition comprising a configuration in which the radius of curvature of the surface of the fifth lens element proximate to the object plane is less than the radius of curvature of the surface of the fifth lens element distal to the object plane, with the optical arrangement arrayed such that the distance from the first lens element to the second lens element is sufficient to reduce a ray height of a light ray entering the second lens element from the ray height of the same light ray entering said first lens element.