The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2005

Filed:

Mar. 28, 2002
Applicant:

Vincent Vaccarelli, Getzville, NY (US);

Inventor:

Vincent Vaccarelli, Getzville, NY (US);

Assignee:

Leica Microsystems Inc., Depew, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G005/00 ;
U.S. Cl.
CPC ...
Abstract

A microscopy laboratory system for efficient instruction is disclosed. The system comprises a plurality of student microscopes each equipped with a camera for generating an image signal representing a student view image of at least a portion of the field of view of the student microscope, multiplexed control means connected by video cables or wireless technology to the cameras to provide a composite instruction image signal based on student view images from one or more selected microscopes, and a projection unit or other public display for presenting the instruction image to the students in the laboratory. An instructor microscope can also be coupled into the system, and a display image marker is preferably linked to the multiplexed control means for inserting instructor annotations into the displayed instruction image.


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