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USPTO Data Jan 1 1976 - Oct 13 2026
28 Patents
#3 in Depew, NY
#725 in New York
#12,013 in US
#23,285 in the World
Leica Gmbh
Forward Citations = 364
26 inventors:
Depew, NY, United States of America
Leica Gmbh
CIPO Patents = 3
Trademarks = 6
Forward Citations = 364
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26 inventors (with patents filed for the assignee):
David A Luce (9 out of 53 patents)
Werner Holbl (5 out of 15 patents)
Christopher J Percival (4 out of 7 patents)
4. Bernard Grolman (3 out of 20 patents)
5. Alfred Hengst (2 out of 19 patents)
6. Jeffrey M Sabin (2 out of 10 patents)
7. H Peter Farnung (2 out of 4 patents)
8. Heinz Keiner (2 out of 8 patents)
9. Shawn E Thompson (2 out of 2 patents)
10. Joseph L Zelvin (2 out of 5 patents)
11. Henry A Meier, Jr (2 out of 2 patents)
12. Paul J Klock (2 out of 24 patents)
13. Vincent Vaccarelli (1 out of 7 patents)
14. Donald E Miller (1 out of 4 patents)
15. Ronald J Martino (1 out of 11 patents)
Core Competencies:
Keratometer
Tonometer
Microscope
Optical Properties
Refractometer
Contrast Sensitivity
Glare Tester
Joystick Control
Microscope Stand
Lensmeter
Non-Contact Tonometer
Stereomicroscope
28 patents:
Company Overview
Leica GmbH is a renowned manufacturer specializing in high-quality optical and imaging products. The company is well-known for its precision cameras, binoculars, and other optical devices, catering to both professional and amateur markets. With a strong emphasis on innovation, Leica integrates advanced technology into its products, enhancing user experience and image quality. The company operates globally, with a significant presence in the photography and imaging sectors, reflecting its commitment to craftsmanship and excellence.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Leica Gmbh. Retrieved from https://idiyas.com/company/leica
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
3 patents (CIPO):
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]