The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 1996
Filed:
Jan. 11, 1994
Henry A Meier, Jr, Orchard Park, NY (US);
Thomas F Batten, Clarence Center, NY (US);
Jose L Suro, Alabama, NY (US);
Leica Inc., Depew, NY (US);
Abstract
An apparatus and method for aligning the optical elements of a microscope are disclosed wherein a fixture is provided for locating and mounting a plurality of mirrors for reflecting an object image along an optical path to an adjacent eyepiece connected to the fixture by an eyepiece holder. The eyepiece holder includes an outer sleeve attachable to the fixture, an inner sleeve transversely movable within the outer sleeve for slidably receiving the eyepiece, and positioning means comprising a plurality of angularly spaced screws extending through the outer sleeve for engaging the inner sleeve, whereby the eyepiece may be aligned on the optical path by selectively adjusting the screws.