The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 1996
Filed:
Jan. 12, 1994
Applicant:
Inventors:
Henry A Meier, Jr, Orchard Park, NY (US);
Vincent Vaccarelli, Getzville, NY (US);
Assignee:
Leica Inc., Depew, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G03B / ; B65D / ;
U.S. Cl.
CPC ...
359391 ; 359380 ; 359368 ; 359507 ; 359510 ; 428 352 ; 524 13 ; 2064842 ;
Abstract
Microscopes having plastic components such as knobs, covers and eyepiece rings are rendered antistatic by using static charge dissipating plastic materials instead of conventional plastics. Such antistatic microscopes are especially useful in the manufacture and inspection of semi-conductors which are easily damaged by exposure to static charges.