Leuven, Belgium

Layerwise Nv


USPTO Granted Patents = 11

% Expired Patents = 9.1


Forward Citations = 86

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22 inventors (with patents filed for the assignee):

goldMedal Nachiketa Ray (6 out of 7 patents)

silverMedal Jonas Van Vaerenbergh (4 out of 8 patents)

bronzeMedal Jan Plas (4 out of 4 patents)

4.  Brawley Valkenborgs (3 out of 6 patents)

5.  Sam Coeck (3 out of 8 patents)

6.  Gokula Krishna Muralidharan (2 out of 2 patents)

7.  Luc Cuyt (1 out of 3 patents)

8.  Jan Van Rompay (1 out of 1 patent)

9.  Rudy Raeymaekers (1 out of 2 patents)

10.  Peter Mercelis (1 out of 3 patents)

11.  Wilfried Van Der Perre (1 out of 1 patent)

12.  Jean-Pierre Kruth (1 out of 4 patents)

13.  Ignace Naert (1 out of 1 patent)

14.  Ben Vandenbroucke (1 out of 1 patent)

15.  Karel Lietaert (1 out of 1 patent)


11 patents:

Company Overview
Layerwise Nv is a pioneering company based in Leuven, Belgium, specializing in advanced additive manufacturing technologies. The organization focuses on the development and production of innovative 3D printing solutions, particularly for industrial applications. Layerwise is dedicated to enhancing manufacturing processes across various sectors, including aerospace, automotive, and medical devices, by leveraging its expertise in materials science and engineering. Its commitment to research and development positions it at the forefront of the additive manufacturing landscape.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 6 2026

11 Patents

#13 in Leuven

#238 in Belgium

#51,714 in the World

Leuven, BE
Leuven, Belgium
Forward Citations = 86

22 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Layerwise Nv. Retrieved from https://idiyas.com/company/layerwise-nv

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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