For the Inventor, By the Inventor

Enter assignee name

Cleveland, OH, United States of America

Keithley Instruments, Inc.

USPTO Granted Patents = 150

% Expired Patents = 9.3

CIPO Patents = 1

EPO Patents = 3

Trademarks = 2

Forward Citations = 882

Loading Chart...

Loading Chart...

88 inventors (with patents filed for the assignee):

Wayne C Goeke (45 out of 47 patents)

Gregory Sobolewski (29 out of 29 patents)

James A Niemann (16 out of 17 patents)

4. John G Banaska (11 out of 11 patents)

5. William Knauer (11 out of 11 patents)

6. Martin J Rice (11 out of 11 patents)

7. George John Polly (10 out of 13 patents)

8. Brian Patrick Frackelton (9 out of 17 patents)

9. Michael D Rayman (7 out of 7 patents)

10. Gregory Roberts, Ii (5 out of 5 patents)

11. William C Weeman (5 out of 5 patents)

12. Lawrence J Kizlik (5 out of 5 patents)

13. Alexander N Pronin (4 out of 5 patents)

14. Kevin Cawley (4 out of 4 patents)

15. Matthew Holtz (4 out of 4 patents)

Core Competencies:

Power Supply

Impedance Measurement

Current Source

Analog-to-Digital Converter

Device Testing

Dynamic Characterization

Measurement Calibration

Graphical User Interface

High-Speed Switch

Safety Adapter

Leakage Compensation

Voltage Clamp

150 patents: Sort by Forward Citations

1. 12764047 - Dual-band instrument communication to achieve high bandwidth and low latency (2026-10-13),

2. 12748145 - Low current leakage measurement on a high current unified static and dynamic characterization platform (2026-09-29),

3. 12742819 - Solderless high current, high voltage, high bandwidth test fixture (2026-09-22),

4. 12580488 - High-density multi-channel power supply in a test and measurement instrument (2026-03-17),

5. 12578379 - Unified measurement system for static and dynamic characterization of a device under test (2026-03-17),

6. 12531566 - Combining sampling analog-to-digital converter with continuously integrating analog-to-digital converter (2026-01-20),

7. 12498414 - Unified measurement system for static and dynamic characterization of a device under test (2025-12-16),

8. 12498409 - Correcting for load resistance when making I-V measurements with constant drain voltage on power MOSFETS (2025-12-16),

9. 12363853 - Direct instrument-to-instrument communication without using a system controller (2025-07-15),

10. 12306209 - High current extension for a dual-stage source measure unit (2025-05-20),

11. 12265115 - Digital loop dual-stage source measure unit (2025-04-01),

12. 12241939 - Estimation of unknown electronic load (2025-03-04),

13. 12050243 - Safety container for high power device testing over a range of temperatures (2024-07-30),

14. 11971434 - Power source with error detection (2024-04-30),

15. 11959937 - Triaxial power and control systems and methods (2024-04-16),

Company Overview

Keithley Instruments, Inc., based in Cleveland, OH, specializes in the development and manufacturing of advanced test measurement instruments. The company is recognized for its expertise in power supply solutions, impedance measurement, and current sourcing technologies. Keithley's offerings are integral to device testing and dynamic characterization, ensuring precision in measurement calibration. With a focus on enhancing graphical user interfaces, Keithley supports a wide range of applications across various industries, contributing to innovation in electronic testing and measurement.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 20 2026

150 Patents

#18 in Cleveland, OH

#120 in Ohio

#2,631 in US

#5,448 in the World

Cleveland, OH, United States of America

Keithley Instruments, Inc.

Forward Citations = 882

88 inventors:

Wayne C Goeke (45 out of 47 patents)

Gregory Sobolewski (29 out of 29 patents)

James A Niemann (16 out of 17 patents)

4. John G Banaska (11 out of 11 patents)

5. William Knauer (11 out of 11 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Keithley Instruments, Inc.. Retrieved from https://idiyas.com/company/keithley-instruments

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

Loading…