Company Filing History:
Years Active: 2007-2025
Title: Alexander N Pronin: Innovator in Integrated Circuit Testing
Introduction
Alexander N Pronin is a notable inventor based in Twinsburg, OH (US). He has made significant contributions to the field of integrated circuit testing, holding a total of 4 patents. His work has advanced the methodologies used in testing electronic components, particularly MOSFET devices.
Latest Patents
One of his latest patents is a probe card system for testing an integrated circuit. This innovative system includes a probe card with a probe needle and a probe body that encloses a pressure chamber. The design features a unitary sidewall and an end cap that allows for the introduction of compressed gas into the pressure chamber. The probe needle, which is supported by the probe body, extends through an outlet passage, enabling effective testing of integrated-circuit wafers.
Another significant patent involves gate charge measurements using two source measure units. This testing environment is designed for MOSFET devices, where one measuring unit connects to the gate and another to the drain. The system automatically switches modes as the MOSFET device turns on, allowing for seamless data collection and analysis without user intervention.
Career Highlights
Alexander N Pronin is currently employed at Keithley Instruments, Inc., where he continues to develop innovative testing solutions. His expertise in integrated circuit testing has positioned him as a valuable asset in the field of electronics.
Collaborations
Throughout his career, Pronin has collaborated with notable colleagues, including Vladimir V Genkin and Joseph A Peters. These partnerships have contributed to the advancement of technologies in the testing of electronic components.
Conclusion
Alexander N Pronin's contributions to integrated circuit testing through his patents and work at Keithley Instruments, Inc. highlight his role as an influential inventor in the electronics industry. His innovative approaches continue to shape the future of testing methodologies.