The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 2026
Filed:
Jun. 20, 2023
Applicant:
Keithley Instruments, Llc, Solon, OH (US);
Inventor:
Gregory Sobolewski, Brecksville, OH (US);
Assignee:
Keithley Instruments, LLC, Solon, OH (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/30 (2006.01); G01R 31/26 (2020.01); G01R 31/327 (2006.01); G01R 31/52 (2020.01);
U.S. Cl.
CPC ...
G01R 31/3008 (2013.01); G01R 31/2621 (2013.01); G01R 31/2642 (2013.01); G01R 31/3277 (2013.01); G01R 31/52 (2020.01);
Abstract
A testing system includes a Device Under Test (DUT) interface structured to couple to one or more DUTs and a device characterization circuit structured to be controlled to perform static testing and dynamic testing of the one or more DUTs. The device characterization circuit includes a drain amplifier coupled to a drain of the one or more DUTs that is structured to measure drain leakage current. Methods of measuring drain current in a device that performs both static and dynamic testing are also described.