The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2026

Filed:

Apr. 03, 2024
Applicant:

Keithley Instruments, Llc, Solon, OH (US);

Inventor:

Gregory Sobolewski, Brecksville, OH (US);

Assignee:

Keithley Instruments, LLC, Solon, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2837 (2013.01); G01R 31/2621 (2013.01); G01R 31/2844 (2013.01);
Abstract

A test and measurement system includes a device under test (DUT) interface structured to couple to first and second DUTs that are coupled to form a half bridge circuit. A characterization circuit is controlled to perform static testing and dynamic testing of the first and second DUTs. The characterization circuit includes a solid-state bias tee including the first DUT and a first drive voltage generator that provides a DC pulse signal and AC signal on a gate node of the first DUT to cause the first DUT to supply current and voltage signals to the second DUT for static and dynamic characterization of the second DUT. One characterization circuit can generate, at the same time, the gate charge characterization parameters for one DUT and reverse current path (e.g., body diode) characterization of another DUT.


Find Patent Forward Citations

Loading…