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For the Inventor, By the Inventor

Cologne, Germany

Inficon Gmbh


USPTO Granted Patents = 182



Trademarks = 46

Forward Citations = 582

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148 inventors (with patents filed for the assignee):

goldMedal Daniel Wetzig (37 out of 38 patents)

silverMedal Silvio Decker (20 out of 21 patents)

bronzeMedal Werner Grosse Bley (20 out of 25 patents)

4.  Norbert Rolff (16 out of 19 patents)

5.  Martin Wüest (13 out of 17 patents)

6.  Randolf Paul Rolff (12 out of 12 patents)

7.  Shawn M Briglin (7 out of 14 patents)

8.  Thomas Böhm (7 out of 7 patents)

9.  Michael F Vollero (6 out of 6 patents)

10.  Ludolf Gerdau (6 out of 6 patents)

11.  Gerhard Küster (6 out of 6 patents)

12.  Rudi Widt (6 out of 8 patents)

13.  Per Björkman (6 out of 7 patents)

14.  Mohamed Buhary Rinzan (5 out of 6 patents)

15.  Fredrik Enquist (5 out of 13 patents)


Core Competencies:
Optical Sensors
Gas Chromatography
Mass Spectrometry
Leak Detection
Thin Film Deposition
Chemical Analysis
Ion Source Assembly
Sniffer Probes
Gas Analyzers
Tightness Testing
Process Monitoring
Photoionization

182 patents:

1. 12494358 - Ion source assembly with multiple elliptical filaments (2025-12-09),
2. 12492960 - Vacuum leak detection system, gas control unit and method for gas leak detection (2025-12-09),
3. 12455207 - Method for detecting test gas exiting a test body using an optical sensor (2025-10-28),
4. 12436058 - Sniffer probe with shielding (2025-10-07),
5. 12347667 - Method of auto tuning one or more sensors (2025-07-01),
6. 12315892 - Tightness test of a liquid filled test object (2025-05-27),
7. 12276649 - Method for displaying concentration data of a substance and an associated apparatus (2025-04-14),
8. 12266552 - System and method for monitoring semiconductor processes (2025-04-01),
9. 12227846 - Monitoring thin film deposition (2025-02-18),
10. 12203887 - Partial pressure gauge assembly for process contaminant detection using photoionization and associated method (2025-01-21),
11. 12198897 - HTCC antenna for generation of microplasma (2025-01-14),
12. 12106953 - Wide range electron impact ion source for a mass spectrometer (2024-10-01),
13. RE50099 - Device and method for distinguishing a test gas escaping from a leak from an interfering gas (2024-08-27),
14. 12044664 - Method for adapting the concentration of a sample gas in a gas mixture to be analysed by a gas chromatograph assembly, and chromatograph assembly therefore (2024-07-23),
15. 11982651 - Method for adapting the concentration of a sample gas in a gas mixture to be analysed by a gas chromatograph assembly, and chromatograph assembly therefore (2024-05-14),
INFICON GmbH is a global supplier of innovative and advanced measurement and control instrumentation for the semiconductor, automotive, and vacuum coating industries. Their cutting-edge solutions help manufacturers improve product quality, increase productivity, and reduce costs. With over 50 years of experience, INFICON is known for their expertise in vacuum technology, leak detection, and process control. They offer a wide range of high-performance products and services, including vacuum gauges, leak detectors, gas analyzers, and thin film deposition controllers.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 30 2025

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182 Patents

#6 in Cologne

#362 in Germany

#4,453 in the World

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Cologne, Germany

Inficon Gmbh

Forward Citations = 582

148 inventors:

goldMedal Daniel Wetzig (37 out of 38 patents)

silverMedal Silvio Decker (20 out of 21 patents)

bronzeMedal Werner Grosse Bley (20 out of 25 patents)

4.  Norbert Rolff (16 out of 19 patents)

5.  Martin Wüest (13 out of 17 patents)

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