The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Oct. 31, 2022
Inficon Gmbh, Cologne, DE;
Stefan Mebus, Cologne, DE;
INFICON GmbH, Cologne, DE;
Abstract
A method for leak testing a test specimen includes the following steps: placing the test specimen in a test chamber, testing a leak-tightness of the test specimen in the test chamber, opening the test chamber and removing the test specimen if the leak test has determined that the test specimen is leak-tight, and blocking the test chamber from opening to prevent a removal of the test specimen if the leak test has determined a leak in the test specimen. A leak testing device includes a test chamber receiving the test specimen, a leak detector connected to the test chamber, and a blocking device.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile