For the Inventor, By the Inventor

Enter assignee name

Iix Inc.

Calculating rank

USPTO Granted Patents = 16

% Expired Patents = 12.5

EPO Patents = 3

Trademarks = 2

Forward Citations = 10

Loading Chart...

Loading Chart...

14 inventors (with patents filed for the assignee):

Hiroshi Murase (12 out of 33 patents)

Takashi Sakamoto (5 out of 43 patents)

Makoto Hatakenaka (5 out of 30 patents)

4. Masayoshi Imoto (3 out of 3 patents)

5. Yoshihide Minegishi (3 out of 3 patents)

6. Norimasa Senda (3 out of 3 patents)

7. Mitsuo Hagiwara (2 out of 5 patents)

8. Ryohei Hatta (2 out of 2 patents)

9. Hideaki Suzuki (1 out of 72 patents)

10. Keisuke Okada (1 out of 6 patents)

11. Tomoyuki Takano (1 out of 1 patent)

12. Shinya Tabata (1 out of 1 patent)

13. Al Burgio (1 out of 1 patent)

14. Kazunori Yoshizawa (1 out of 1 patent)

15. Shigeharu Ishikawa (11 patents)

16 patents: Sort by Forward Citations

1. 12159605 - Unevenness correction data generation device (2024-12-03),

2. 12148402 - Panel drive circuit (2024-11-19),

3. 11990104 - Input signal correction device (2024-05-21),

4. 11823610 - Input signal correction device (2023-11-21),

5. 10970825 - Image processing method and image processing apparatus for executing image processing method (2021-04-06),

6. 10803782 - Unevenness correction data generation method and unevenness correction data generation system (2020-10-13),

7. 10750148 - Unevenness correction system, unevenness correction apparatus and panel drive circuit (2020-08-18),

8. 10436637 - Unevenness evaluation method and unevenness evaluation apparatus (2019-10-08),

9. 10145538 - Light-emitting apparatus, calibration coefficient calculation method, and method for calibrating captured image of examination target item (2018-12-04),

10. 10015373 - Image processing method and image processing apparatus for executing image processing method (2018-07-03),

11. 9554044 - Image quality adjustment apparatus, correction data generation method, and image quality adjustment technique using the apparatus and method (2017-01-24),

12. 9277209 - Pattern position detection method, pattern position detection system, and image quality adjustment technique using the method and system (2016-03-01),

13. 9246766 - Method and apparatus for a distributed internet architecture (2016-01-26),

14. 8941742 - Luminance measurement method, luminance measurement device, and image quality adjustment technique using the method and device (2015-01-27),

15. 8866914 - Pattern position detection method, pattern position detection system, and image quality adjustment technique using the method and system (2014-10-21),

Company Overview

Iix Inc. is a technology company based in Tokyo, Japan, specializing in advanced telecommunications and networking solutions. The organization focuses on developing innovative infrastructure that enhances connectivity and data transmission capabilities across various sectors. With a commitment to research and development, Iix Inc. aims to provide cutting-edge services that support the evolving needs of businesses and consumers in an increasingly digital world. Its expertise spans cloud computing, data centers, and network optimization, positioning it as a key player in the technology landscape.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

16 Patents

#1,501 in Tokyo

#3,343 in Japan

#37,868 in the World

Iix Inc.

Forward Citations = 10

14 inventors:

Hiroshi Murase (12 out of 33 patents)

Takashi Sakamoto (5 out of 43 patents)

Makoto Hatakenaka (5 out of 30 patents)

4. Masayoshi Imoto (3 out of 3 patents)

5. Yoshihide Minegishi (3 out of 3 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Iix Inc.. Retrieved from https://idiyas.com/company/iix

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

Loading…