The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Dec. 02, 2019
Iix Inc., Tokyo, JP;
Photolab Inc., Urayasu-shi, Chiba-ken, JP;
Hiroshi Murase, Urayasu, JP;
IIX INC., Tokyo, JP;
PHOTOLAB INC., Urayasu-shi, JP;
Abstract
An unevenness correction data generation method provided for generating unevenness correction data for effectively improving the yield of a display panel. The method includes: a step of capturing an image of a display panel where a predetermined pattern is displayed; a step of generating iteration data for correcting unevenness of the captured image; a step of storing the iteration data in a storage means; a step of capturing an image of the display panel where a pattern in the storage means is displayed; a step of generating iteration data for correcting unevenness of the captured image; a step of storing iteration data in the storage means; a step of judging whether or not an ending condition for ending repetition of the steps is satisfied; and a step of generating the unevenness correction data based on the iteration data stored in the storage means the ending condition is satisfied.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile