The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2015
Filed:
Jun. 19, 2014
Iix Inc., Shinagawa-ku, Tokyo, JP;
Hiroshi Murase, Tokyo, JP;
IIX Inc., Tokyo, JP;
Abstract
Provided is a luminance measurement method for accurately measuring luminance of each pixel even if pixel images of a display panel overlap each other on an imaging surface of a camera. A central exposure factor indicating luminance of the central part of the pixel image is calculated on the basis of an output of a picture element corresponding to the central part. A peripheral exposure factor indicating luminance of the peripheral part of the pixel image is calculated on the basis of an output of picture elements corresponding to the peripheral part of the pixel image is calculated, all pixels of the display panel are sorted into a plurality of groups, sequentially turned on one group after another, and imaged by the camera, and the luminance of all the pixels of the display panel is calculated based on this imaged image, the central exposure factor, and the peripheral exposure factor.