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Suwon-si, South Korea

Etamax Co., Ltd

USPTO Granted Patents = 4

Forward Citations = 6

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8 inventors (with patents filed for the assignee):

Huyndon Jung (2 out of 2 patents)

Youngbeom Kim (1 out of 2 patents)

Jong-In Shim (1 out of 8 patents)

4. Min Cheol Park (1 out of 196 patents)

5. Jongho Yoon (1 out of 1 patent)

6. Dong Pyo Han (1 out of 2 patents)

7. Hyun Don Jung (1 out of 1 patent)

8. Min-jung Lee (1 out of 1 patent)

4 patents: Sort by Forward Citations

1. 12372469 - Defect classification equipment for silicon carbide substrate using single incident light-based photoluminescence and defect classification method using the same (2025-07-29),

2. 11605560 - Die division method and inspection apparatus for avoiding defects locations on silicon carbide wafers (2023-03-14),

3. 11009461 - Defect investigation device simultaneously detecting photoluminescence and scattered light (2021-05-18),

4. 9945898 - Method and device for measuring internal quantum efficiency of an optical element (2018-04-17),

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USPTO Data Jan 1 1976 - Jan 6 2026

4 Patents

#44 in Suwon-si

#2,091 in South Korea

Suwon-si, South Korea

Etamax Co., Ltd

Forward Citations = 6

8 inventors:

Huyndon Jung (2 out of 2 patents)

Youngbeom Kim (1 out of 2 patents)

Jong-In Shim (1 out of 8 patents)

4. Min Cheol Park (1 out of 196 patents)

5. Jongho Yoon (1 out of 1 patent)

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