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For the Inventor, By the Inventor

Suwon, South Korea

Etamax Co., Ltd


USPTO Granted Patents = 4

Forward Citations = 8

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8 inventors (with patents filed for the assignee):

goldMedal Huyndon Jung (2 out of 2 patents)

silverMedal Youngbeom Kim (1 out of 2 patents)

bronzeMedal Jong-In Shim (1 out of 8 patents)

4.  Min Cheol Park (1 out of 196 patents)

5.  Jongho Yoon (1 out of 1 patent)

6.  Dong Pyo Han (1 out of 2 patents)

7.  Hyun Don Jung (1 out of 1 patent)

8.  Min-jung Lee (1 out of 1 patent)


4 patents:

1. 12372469 - Defect classification equipment for silicon carbide substrate using single incident light-based photoluminescence and defect classification method using the same (2025-07-29),
2. 11605560 - Die division method and inspection apparatus for avoiding defects locations on silicon carbide wafers (2023-03-14),
3. 11009461 - Defect investigation device simultaneously detecting photoluminescence and scattered light (2021-05-18),
4. 9945898 - Method and device for measuring internal quantum efficiency of an optical element (2018-04-17),
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USPTO Data Jan 1 1976 - Oct 20 2026

4 Patents

#53 in Suwon

#2,202 in South Korea

Suwon, KR
Suwon, South Korea

Etamax Co., Ltd

Forward Citations = 8

8 inventors:

goldMedal Huyndon Jung (2 out of 2 patents)

silverMedal Youngbeom Kim (1 out of 2 patents)

bronzeMedal Jong-In Shim (1 out of 8 patents)

4.  Min Cheol Park (1 out of 196 patents)

5.  Jongho Yoon (1 out of 1 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Etamax Co., Ltd. Retrieved from https://idiyas.com/company/etamax-company

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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