Seoul, South Korea

Jong-In Shim


 

Average Co-Inventor Count = 3.1

ph-index = 1

Forward Citations = 3(Granted Patents)


Location History:

  • Ansan-shi, KR (2004)
  • Seoul, KR (2008 - 2021)

Company Filing History:


Years Active: 2004-2021

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8 patents (USPTO):Explore Patents

Title: Jong-In Shim: Innovator in Optical Measurement Technologies

Introduction

Jong-In Shim is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of optical measurement technologies, holding a total of 8 patents. His work focuses on improving the accuracy and efficiency of measuring devices, particularly in relation to light-emitting diodes.

Latest Patents

One of his latest patents is a method and apparatus for measuring the resistance of light-emitting diodes. This invention allows for the accurate measurement of the resistance value of a light-emitting diode in a non-destructive manner. The method involves measuring a first radiative current component of an injected current for the diode, generating a second radiative current component, and computing the resistance value using both components.

Another notable patent is a method for measuring the internal quantum efficiency of an optical element. This method includes measuring the intensity of light emitted from the optical element when an injection current is applied. It calculates a relative radiative efficiency and extracts a reference injection current to minimize changes in the recombination coefficient within the active layer of the optical element. This innovative approach allows for the calculation of internal quantum efficiencies across various injection currents.

Career Highlights

Jong-In Shim has worked with esteemed organizations such as the Industry-University Cooperation Foundation at Hanyang University and Samsung Electronics. His experience in these institutions has allowed him to develop and refine his innovative ideas in optical technologies.

Collaborations

He has collaborated with notable colleagues, including Hyunsung Kim and Dong Pyo Han. Their combined expertise has contributed to the advancement of research and development in their respective fields.

Conclusion

Jong-In Shim's contributions to optical measurement technologies demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in measuring light-emitting diodes and optical elements. His work continues to influence the industry and inspire future advancements in technology.

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