Company Filing History:
Years Active: 2025
Title: Min-jung Lee: Innovator in Silicon Carbide Substrate Technology
Introduction
Min-jung Lee is a prominent inventor based in Gunpo-si, South Korea. He has made significant contributions to the field of semiconductor technology, particularly in the area of silicon carbide substrates. His innovative work has led to the development of advanced defect classification equipment that enhances the quality and reliability of semiconductor materials.
Latest Patents
Min-jung Lee holds a patent for a groundbreaking invention titled "Defect classification equipment for silicon carbide substrate using single incident light-based photoluminescence and defect classification method using the same." This patent describes a stack fault inspection apparatus and method that includes a sample stage for fixing the silicon carbide substrate. The apparatus allows incident light to scan the substrate surface effectively. It features an incident light source that irradiates vertical illumination light of a wavelength greater than the band gap energy of the substrate. Additionally, a photomultiplier tube (PMT) is utilized to obtain a photoluminescence mapping image from the substrate surface. The controller processes this mapping image to identify stacking faults, thereby improving the inspection process for silicon carbide substrates.
Career Highlights
Min-jung Lee is currently employed at Etamax Co., Ltd., where he continues to innovate and develop new technologies in the semiconductor industry. His expertise in photoluminescence and defect classification has positioned him as a key figure in advancing semiconductor manufacturing processes.
Collaborations
Min-jung Lee collaborates with Huyndon Jung, contributing to the development of cutting-edge technologies in their field. Their partnership enhances the research and development efforts at Etamax Co., Ltd.
Conclusion
Min-jung Lee's contributions to silicon carbide substrate technology through his innovative patent and career at Etamax Co., Ltd. highlight his role as a leading inventor in the semiconductor industry. His work continues to pave the way for advancements in material quality and inspection methods.