Poestenkill, NY, United States of America

Duffers Scientific, Inc.

Calculating rank

USPTO Granted Patents = 8

CIPO Patents = 1

Trademarks = 2

Forward Citations = 112

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2 inventors (with patents filed for the assignee):

Hugo S Ferguson (8 out of 16 patents)

David L Hollinger (1 out of 1 patent)

Hugo Stanley Ferguson (0 patent)

8 patents: Sort by Forward Citations

1. 5202542 - Test specimen/jaw assembly that exhibits both self-resistive and (1993-04-13),

2. 5199304 - Apparatus for optically measuring specimen deformation during material (1993-04-06),

3. 5195378 - Dynamic thermal-mechanical material testing system utilizing a balanced (1993-03-23),

4. 5092179 - Dynamic material testing system having independent control over specimen (1992-03-03),

5. 4734555 - Method and apparatus for measuring and controlling indentation in (1988-03-29),

6. 4721906 - One step RMS system (1988-01-26),

7. 4631697 - Signal controlled waveform recorder (1986-12-23),

8. 4509000 - Bumpless feedback switching apparatus for use in a servo system (1985-04-02),

Company Overview

Duffers Scientific, Inc. is a leading provider of innovative scientific equipment and solutions. With a focus on research and development, we deliver high-quality products that meet the needs of our customers in various industries. Our team of experts is dedicated to advancing scientific progress through cutting-edge technology and superior customer service.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Nov 3 2026

8 Patents

#1 in Poestenkill, NY

#2,109 in New York

#35,984 in US

Poestenkill, NY, United States of America

Duffers Scientific, Inc.

Forward Citations = 112

2 inventors:

Hugo S Ferguson (8 out of 16 patents)

David L Hollinger (1 out of 1 patent)

Hugo Stanley Ferguson (0 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Duffers Scientific, Inc.. Retrieved from https://idiyas.com/company/duffers-scientific

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (CIPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]