The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 1993
Filed:
Feb. 20, 1992
Hugo S Ferguson, Averill Park, NY (US);
Duffers Scientific, Inc., Poestenkill, NY (US);
Abstract
A technique for in a thermo-dynamic material testing system for optically measuring changes in specimen size that occur during material testing. Specifically, a pair of jaws, one movable and one fixed, engage opposite ends of the test specimen and are controllably moved with respect to each other in order to impart a desired tensile or compressive force to the specimen. A fixed light source emits a planar light beam, typically collimated laser radiation, that is directed at the specimen by two mirrors mounted to the jaws and on one side of the specimen. One of these mirrors is secured to and moves with the moving jaw and directs the light beam toward the specimen along a transverse path; the other mirror is mounted to the fixed jaw. A fixed light receiver receives the light beam after it has passed over the specimen and has been reflected by a similar pair of mirrors mounted to the jaws but on the other side of the specimen. Changes in the positional profile of the light beam caused by specimen deformation are detected by the receiver and converted into physical measurements of deformation and deformation rate.