The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 1992
Filed:
Mar. 08, 1991
Applicant:
Inventor:
Hugo S Ferguson, Averill Park, NY (US);
Assignee:
Duffers Scientific, Inc., Poestenkill, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D / ;
U.S. Cl.
CPC ...
73790 ;
Abstract
Apparatus, and an accompanying method for use therein, for a dynamic material testing system, and particularly for one that tests a specimen by compressively deforming its work zone and that has independent control over specimen deformation (strain) and strain rate. The apparatus can also simultaneously direct resistance heat or conductively cool the specimen, under controlled conditions, in order to establish isothermal planes at a desired substantially uniform temperature throughout the specimen work zone before, during and after each compressive deformation thereof.