The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 23, 1993
Filed:
May. 02, 1991
Hugo S Ferguson, Averill Park, NY (US);
Duffers Scientific, Inc., Poestenkill, NY (US);
Abstract
Apparatus for a dynamic thermal-mechanical material testing system that not only self-resistively heats and deforms a specimen, both under controlled conditions, but also substantially reduces adverse affects in specimen performance, such as magnetically induced motion and non-uniform specimen heating, that would otherwise result from magnetic fields which impinge upon the specimen and are caused by high heating currents flowing in the apparatus. This reduction is achieved by spatially locating high current carrying conductors used in the apparatus such that these conductors collectively generate substantially balanced, i.e. substantially equal, and opposite magnetic fields that effectively cancel each other out in a volumetric region in the apparatus which contains the specimen and particularly its work zone.