IDiyas

For the Inventor, By the Inventor

Kgs. Lyngby, Denmark

Capres A/s


USPTO Granted Patents = 19


Trademarks = 3

Forward Citations = 30

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35 inventors (with patents filed for the assignee):

goldMedal Peter Folmer Nielsen (10 out of 11 patents)

silverMedal Dirch Hjorth Petersen (5 out of 7 patents)

bronzeMedal Hans Henrik Jochumsen (4 out of 16 patents)

4.  Niels Torp Madsen (4 out of 12 patents)

5.  Henrik Baekbo (4 out of 4 patents)

6.  Chaker Khalfaoui (4 out of 4 patents)

7.  Lauge Gammelgaard (4 out of 4 patents)

8.  Lars Norregaard (4 out of 4 patents)

9.  Anders Jensen (4 out of 4 patents)

10.  Jannik Sadolin (4 out of 4 patents)

11.  Hans Henrik Jankjaer (4 out of 4 patents)

12.  Christian Leth Petersen (3 out of 14 patents)

13.  Ole Hansen (3 out of 12 patents)

14.  Peter R E Petersen (3 out of 3 patents)

15.  Torben Mikael Hansen (3 out of 3 patents)


19 patents:

1. 11215638 - Probe for testing an electrical property of a test sample (2022-01-04),
2. 11131700 - Position correction method and a system for position correction in relation to four probe resistance measurements (2021-09-28),
3. 9983231 - Deep-etched multipoint probe (2018-05-29),
4. 9644939 - Single-position hall effect measurements (2017-05-09),
5. 8907690 - Method of determining an electrical property of a test sample (2014-12-09),
6. D717190 - Rack, cover, connector, and handle assembly for a rack-supported multi-point electrical probe holder (2014-11-11),
7. D717189 - Cover, connector, and handle assembly attachable to a rack for a rack-supported multi-point electrical probe holder (2014-11-11),
8. D717188 - Rack for supporting a multi-point electrical probe holder (2014-11-11),
9. 8836358 - Automated multi-point probe manipulation (2014-09-16),
10. 8378697 - Method for providing alignment of a probe (2013-02-19),
11. 8310258 - Probe for testing electrical properties of a test sample (2012-11-13),
12. 8058886 - Device including a contact detector (2011-11-15),
13. 7944222 - Eliminating inline positional errors for four-point resistance measurement (2011-05-17),
14. 7936176 - Method for providing alignment of a probe (2011-05-03),
15. 7852093 - Eliminating inline positional errors for four-point resistance measurement (2010-12-14),
CAPRES A/S is a leading technology company specializing in semiconductor wafer characterization systems. We develop highly advanced equipment and software solutions for measuring electrical and optical properties of semiconductor materials. Our innovative technology enables precise and reliable analysis, helping our customers optimize their semiconductor manufacturing processes. With years of expertise and a commitment to excellence, CAPRES A/S strives to be at the forefront of technological advancements in the semiconductor industry.
This text is generated by artificial intelligence and may not be accurate.

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USPTO Data Jan 1 1976 - Dec 9 2025

19 Patents

#4 in Kgs. Lyngby

#149 in Denmark

#31,670 in the World

...
Kgs. Lyngby, Denmark

Capres A/s

Forward Citations = 30

35 inventors:

goldMedal Peter Folmer Nielsen (10 out of 11 patents)

silverMedal Dirch Hjorth Petersen (5 out of 7 patents)

bronzeMedal Hans Henrik Jochumsen (4 out of 16 patents)

4.  Niels Torp Madsen (4 out of 12 patents)

5.  Henrik Baekbo (4 out of 4 patents)

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