The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2022
Filed:
Mar. 02, 2018
Applicant:
Capres A/s, Kgs. Lyngby, DK;
Inventor:
Lior Shiv, Hillerod, DK;
Assignee:
CAPRES A/S, Kgs. Lyngby, DK;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06738 (2013.01); G01R 1/07307 (2013.01); G01R 31/2889 (2013.01);
Abstract
A probe for direct nano- and micro-scale electrical characterization of materials and semi conductor wafers. The probe () comprises a probe body (), a first cantilever () extending from the probe body. The first cantilever defining a first loop with respect to said probe body. The probe further comprises a first contact probe being supported by said first cantilever, and a second contact probe being electrically insulated from the first contact probe. The second contact probe being supported by the first cantilever or by a second cantilever () extending from the probe body.