The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 28, 2021

Filed:

Jan. 08, 2018
Applicant:

Capres A/s, Kgs. Lyngby, DK;

Inventors:

Frederik Westergaard Osterberg, Hellerup, DK;

Alberto Cagliani, Copenhagen, DK;

Dirch Hjorth Petersen, Herlev, DK;

Ole Hansen, Horsholm, DK;

Assignee:

CAPRES A/S, Kgs. Lyngby, DK;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 27/14 (2006.01);
U.S. Cl.
CPC ...
G01R 27/08 (2013.01); G01R 1/06794 (2013.01); G01R 1/073 (2013.01); G01R 27/14 (2013.01);
Abstract

The present invention relates to a method of establishing specific electrode positions by providing a multi-point probe and a test sample. The method comprises the measuring or determining of a distance between two of the electrodes of the multi-point probe and establishing a resistance model representative of the test sample. The method further comprises the performing of at least three different sheet resistance measurements and establishing for each of the different sheet resistance measurement a corresponding predicted sheet resistance based on the resistance model. Thereafter the method comprises the establishment of a set of differences constituting the difference between each of the predicted sheet resistance and its corresponding measured sheet resistance, and deriving the specific electrode positions of the multi-point probe on the surface of the test sample by using the distance and performing a data fit by minimizing an error function constituting the sum of the set of differences.


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