The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 15, 2011
Filed:
Mar. 12, 2008
Dirch H. Petersen, Dyssegard, DK;
Rong Lin, Kokkedal, DK;
Dirch H. Petersen, Dyssegard, DK;
Rong Lin, Kokkedal, DK;
Capres A/S, Lynby, DK;
Abstract
The present invention relates to a probe for determining an electrical property of an area of a surface of a test sample, the probe is intended to be in a specific orientation relative to the test sample. The probe may comprise a supporting body defining a first surface. A plurality of cantilever arms () may extend from the supporting body in co-planar relationship with the first surface. The plurality of cantilever arms () may extend substantially parallel to each other and each of the plurality of cantilever arms () may include an electrical conductive tip for contacting the area of the test sample by movement of the probe relative to the surface of the test sample into the specific orientation. The probe may further comprise a contact detector () extending from the supporting body arranged so as to contact the surface of the test sample prior to any one of the plurality of cantilever arms () contacting the surface of the test sample when performing the movement.