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% Expired Patents = 15.4

EPO Patents = 2

Forward Citations = 331

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4 inventors (with patents filed for the assignee):

Steven W Meeks (13 out of 72 patents)

Rusmin Kudinar (9 out of 39 patents)

Ronny Soetarman (5 out of 27 patents)

4. Gale A Lane (1 out of 1 patent)

5. Steve W Meeks (0 patent)

13 patents: Sort by Forward Citations

1. 7123357 - Method of detecting and classifying scratches and particles on thin film disks or wafers (2006-10-17),

2. 6909500 - Method of detecting and classifying scratches, particles and pits on thin film disks or wafers (2005-06-21),

3. 6897957 - Material independent optical profilometer (2005-05-24),

4. 6781103 - Method of automatically focusing an optical beam on transparent or reflective thin film wafers or disks (2004-08-24),

5. 6757056 - Combined high speed optical profilometer and ellipsometer (2004-06-29),

6. 6717671 - System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern (2004-04-06),

7. 6665078 - System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern in thin film magnetic disks and silicon wafers (2003-12-16),

8. 6392749 - High speed optical profilometer for measuring surface height variation (2002-05-21),

9. 6268919 - System and method for measuring thin film properties and analyzing two-dimensional histograms using and/not operations (2001-07-31),

10. 6229610 - System and method for measuring thin film properties and analyzing two-dimensional histograms using substraction operation (2001-05-08),

11. 6198533 - High temperature thin film property measurement system and method (2001-03-06),

12. 6130749 - System and method for measuring thin film properties and analyzing (2000-10-10),

13. 6031615 - System and method for simultaneously measuring lubricant thickness and (2000-02-29),

Candela Instruments, based in Fremont, CA, specializes in the development and manufacturing of advanced optical measurement systems. The company focuses on providing innovative solutions for a variety of applications, including scientific research and industrial processes. With a strong emphasis on precision and reliability, Candela Instruments leverages cutting-edge technology to enhance measurement capabilities across diverse sectors, contributing to advancements in fields such as materials science and life sciences.

Profile summary based on public USPTO records.

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USPTO Data Jan 1 1976 - Oct 6 2026

13 Patents

#146 in Fremont, CA

#5,650 in California

#23,815 in US

#44,988 in the World

Fremont, CA, United States of America

Candela Instruments