The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2005
Filed:
Aug. 14, 2002
Applicant:
Steven W. Meeks, Fremont, CA (US);
Inventor:
Steven W. Meeks, Fremont, CA (US);
Assignee:
Candela Instruments, Fremont, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N021/88 ;
U.S. Cl.
CPC ...
Abstract
Scratches, pits and particles which are smaller or larger than the beam size may be measured and identified by a dual beam technique. This invention uses a pair of orthogonally oriented laser beams, one in the radial and one in the circumferential direction. The scattered light from radial and circumferential beams allows the detection and classification of particles, pits and scratches.