The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2004

Filed:

Jul. 02, 1999
Applicant:
Inventors:

Steven W. Meeks, San Jose, CA (US);

Rusmin Kudinar, Union City, CA (US);

Assignee:

Candela Instruments, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/04 ;
U.S. Cl.
CPC ...
G01J 4/04 ;
Abstract

A system and method for performing a magnetic imaging, optical profiling, and measuring lubricant thickness and degradation, carbon wear, carbon thickness, and surface roughness of thin film magnetic disks at angles that are not substantially Brewster's angle of the thin film protective overcoat.


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