EPO Patents = 1

Forward Citations = 5

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4 inventors (with patents filed for the assignee):

Martin Ostermeyer (4 out of 7 patents)

Thomas Brandl (1 out of 1 patent)

Ulrich Muller (1 out of 1 patent)

4. Jan Kristian Kruger (1 out of 1 patent)

5. Ulrich MÜLLER (0 patent)

6. Jan Kristian KRÜGER (0 patent)

5 patents: Sort by Forward Citations

1. 12578278 - Communication between an optical measuring device and two measuring cells accommodated therein (2026-03-17),

2. 10267727 - Determining polarization rotation characteristics of a sample taking into consideration a transmission dispersion (2019-04-23),

3. 10018520 - Temperature calibration for a measuring apparatus (2018-07-10),

4. 9927358 - Wavelength calibration for refractometers (2018-03-27),

5. 8928872 - Temperature modulated refractive index measurement (2015-01-06),

Company Overview

Anton Paar Optotec GmbH is a leading provider of optical measurement solutions for the automotive, aerospace, and manufacturing industries. With a focus on precision and reliability, they offer a range of products including interferometers, surface roughness testers, and imaging systems. Their cutting-edge technology and commitment to innovation make them a trusted partner for companies around the world.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

5 Patents

#1 in Seelze-Letter

#6,097 in Germany

Seelze-Letter, Germany

Anton Paar Optotec Gmbh

Forward Citations = 5

4 inventors:

Martin Ostermeyer (4 out of 7 patents)

Thomas Brandl (1 out of 1 patent)

Ulrich Muller (1 out of 1 patent)

4. Jan Kristian Kruger (1 out of 1 patent)

5. Ulrich MÜLLER (0 patent)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Anton Paar Optotec Gmbh. Retrieved from https://idiyas.com/company/anton-paar-optotec

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

1 patent (EPO):

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]