The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2019
Filed:
Nov. 10, 2015
Anton Paar Optotec Gmbh, Seelze-Letter, DE;
Martin Ostermeyer, Gehrden, DE;
Anton Paar Optotec GmbH, Seelze-Letter, DE;
Abstract
Optical measuring system for determining polarization-optical properties of a sample, which comprises a polarization state generator (PSG) which is configured for preparing a measuring light which is propagating along an analysis beam path with a defined polarization state; a sample receptacle which is arranged downstream of the PSG in the analysis beam path and which is adapted for receiving the sample; a polarization state analyzer (PSA) which is arranged downstream of the sample receptacle in the analysis beam path; a detector which is arranged downstream of the PSA in the analysis beam path for detecting the measuring light, wherein the PSA and the detector are configured for capturing a polarization rotation α(λ) of the measuring light which is caused by the sample; and an evaluation and control unit for evaluating measuring signals from the detector and/or PSA and/or PSG, wherein a wavelength-spectrum of the measuring light contains at least a first wavelength λand a second wavelength λ, wherein the detector is configured for detecting measuring light with the first wavelength separated from measuring light with the second wavelength, and wherein the evaluation and control unit is configured for calculating a polarization rotation α(λ) of the measuring light which is caused by the sample at a standardized wavelength λin dependency from (a) a first polarization rotation α(λ) at the first wavelength λ, (b) a second polarization rotation α(λ) at the second wavelength λ, (c) a first transmission T(λ) at the first wavelength λ, and (d) a second transmission T(λ) at the second wavelength λ.