Konz, Germany

Ulrich Muller

This inventor holds 1 USPTO granted patent. Top assignee: Anton Paar Optotec Gmbh. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ulrich Muller. Retrieved from https://idiyas.com/inventor/ulrich-muller-4tsi6yov

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Ulrich Muller: Innovator in Temperature Modulated Refractive Index Measurement

Introduction

Ulrich Muller is a notable inventor based in Konz, Germany. He has made significant contributions to the field of refractive index measurement, particularly through his innovative methods that enhance measurement accuracy.

Latest Patents

Ulrich Muller holds a patent for a method titled "Temperature Modulated Refractive Index Measurement." This invention focuses on determining the complex temperature coefficient of the refractive index of a sample. The method involves measuring the refractive index over time while modulating the temperature of the sample. The complex temperature coefficient is then calculated based on these measurements. This patent represents a significant advancement in the field, providing a systematic approach to refractive index measurement.

Career Highlights

Ulrich Muller is associated with Anton Paar Optotec GmbH, where he applies his expertise in optical measurement technologies. His work at the company has allowed him to develop and refine innovative measurement systems that are crucial for various applications in science and industry.

Collaborations

Ulrich Muller has collaborated with Jan Kristian Kruger, contributing to advancements in their field through shared knowledge and expertise.

Conclusion

Ulrich Muller is a distinguished inventor whose work in temperature modulated refractive index measurement has made a lasting impact on optical measurement technologies. His contributions continue to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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