The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2018

Filed:

Apr. 27, 2016
Applicant:

Anton Paar Optotec Gmbh, Seelze-Letter, DE;

Inventors:

Martin Ostermeyer, Gehrden, DE;

Thomas Brandl, Hannover, DE;

Assignee:

Anton Paar OptoTec GmbH, Seelze-Letter, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01); G01N 21/41 (2006.01); G01N 21/27 (2006.01); G01N 21/43 (2006.01); G01N 21/552 (2014.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01K 15/005 (2013.01); G01N 21/274 (2013.01); G01N 21/4133 (2013.01); G01N 21/43 (2013.01); G01N 21/552 (2013.01); G01N 2021/3595 (2013.01); G01N 2021/414 (2013.01); G01N 2201/1211 (2013.01);
Abstract

Measuring apparatus-calibration device for calibrating a measuring apparatus-temperature sensor of a, in particular optical, measuring apparatus, wherein the measuring apparatus-calibration device comprises a, preferably measuring apparatus-external, calibration-temperature sensor, which is traceably calibratable itself, for determining a calibration temperature in the region of a measuring surface of the measuring apparatus and a determination unit which is adapted for determining an information which is indicative for a discrepancy between a measuring apparatus-temperature which is captured by the measuring apparatus-temperature sensor in the region of the measuring surface and the calibration temperature, on whose basis the measuring apparatus-temperature sensor is calibratable.


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