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San Jose, CA, United States of America

Advantest America, Inc.

USPTO Granted Patents = 15

Forward Citations = 32

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15 inventors (with patents filed for the assignee):

Florent Cros (5 out of 7 patents)

Yohannes Desta (4 out of 6 patents)

Matthew Losey (4 out of 4 patents)

4. Montray Leavy (3 out of 3 patents)

5. Ting Hu (3 out of 5 patents)

6. Lakshmikanth Namburi (3 out of 9 patents)

7. Lakshmi Namburi (2 out of 2 patents)

8. Matt Losey (2 out of 2 patents)

9. Melvin Khoo (2 out of 11 patents)

10. Chang Huang (2 out of 2 patents)

11. Laksmi Namburi (1 out of 1 patent)

12. Salleh Ismail (1 out of 13 patents)

13. Raffi Garabedian (1 out of 14 patents)

14. Steven Wang (1 out of 5 patents)

15. Donald Eric Thompson (1 out of 1 patent)

15 patents: Sort by Forward Citations

1. 12052830 - Method and process for creating high-performance coax sockets (2024-07-30),

2. 10564184 - Methods to manufacture semiconductor probe tips (2020-02-18),

3. 9678108 - Methods to manufacture semiconductor probe tips (2017-06-13),

4. 9194887 - Fine pitch probes for semiconductor testing, and a method to fabricate and assemble same (2015-11-24),

5. 9000793 - Fine pitch probes for semiconductor testing, and a method to fabricate and assemble same (2015-04-07),

6. 8917106 - Fine pitch microelectronic contact array and method of making same (2014-12-23),

7. 8901950 - Probe head for a microelectronic contactor assembly, and methods of making same (2014-12-02),

8. 8747642 - Superfilling secondary metallization process in MEMS fabrication (2014-06-10),

9. 8344748 - Probe for testing semiconductor devices (2013-01-01),

10. 8309382 - Multi material secondary metallization scheme in MEMS fabrication (2012-11-13),

11. 8305101 - Microelectronic contactor assembly, structures thereof, and methods of constructing same (2012-11-06),

12. 8278956 - Probecard system and method (2012-10-02),

13. 8268156 - Multi material secondary metallization scheme in MEMS fabrication (2012-09-18),

14. 8232818 - Probe head for a microelectronic contactor assembly, the probe head having SMT electronic components thereon (2012-07-31),

15. 8232816 - Probe head with machine mounting pads and method of forming same (2012-07-31),

Advantest America, Inc. is a leading provider of test and measurement solutions for semiconductor and component manufacturers worldwide. With a broad portfolio of automatic test equipment, handlers, and other related products, Advantest offers innovative solutions to help customers improve their testing efficiency, reduce time-to-market, and achieve high-quality results. Advantest America, Inc. is part of the Advantest Corporation, a global company headquartered in Japan.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Dec 9 2025

15 Patents

#394 in San Jose, CA

#4,865 in California

#20,400 in US

#38,669 in the World

San Jose, CA, United States of America

Advantest America, Inc.

Forward Citations = 32

15 inventors:

Florent Cros (5 out of 7 patents)

Yohannes Desta (4 out of 6 patents)

Matthew Losey (4 out of 4 patents)

4. Montray Leavy (3 out of 3 patents)

5. Ting Hu (3 out of 5 patents)

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