For the Inventor, By the Inventor

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San Jose, CA, United States of America

Advantest America, Inc.

USPTO Granted Patents = 15

% Expired Patents = 6.7

Forward Citations = 32

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15 inventors (with patents filed for the assignee):

Florent Cros (5 out of 7 patents)

Yohannes Desta (4 out of 6 patents)

Matthew Losey (4 out of 4 patents)

4. Montray Leavy (3 out of 3 patents)

5. Ting Hu (3 out of 5 patents)

6. Lakshmikanth Namburi (3 out of 9 patents)

7. Lakshmi Namburi (2 out of 2 patents)

8. Matt Losey (2 out of 2 patents)

9. Melvin Khoo (2 out of 11 patents)

10. Chang Huang (2 out of 2 patents)

11. Laksmi Namburi (1 out of 1 patent)

12. Salleh Ismail (1 out of 13 patents)

13. Raffi Garabedian (1 out of 14 patents)

14. Steven Wang (1 out of 5 patents)

15. Donald Eric Thompson (1 out of 1 patent)

15 patents: Sort by Forward Citations

1. 12052830 - Method and process for creating high-performance coax sockets (2024-07-30),

2. 10564184 - Methods to manufacture semiconductor probe tips (2020-02-18),

3. 9678108 - Methods to manufacture semiconductor probe tips (2017-06-13),

4. 9194887 - Fine pitch probes for semiconductor testing, and a method to fabricate and assemble same (2015-11-24),

5. 9000793 - Fine pitch probes for semiconductor testing, and a method to fabricate and assemble same (2015-04-07),

6. 8917106 - Fine pitch microelectronic contact array and method of making same (2014-12-23),

7. 8901950 - Probe head for a microelectronic contactor assembly, and methods of making same (2014-12-02),

8. 8747642 - Superfilling secondary metallization process in MEMS fabrication (2014-06-10),

9. 8344748 - Probe for testing semiconductor devices (2013-01-01),

10. 8309382 - Multi material secondary metallization scheme in MEMS fabrication (2012-11-13),

11. 8305101 - Microelectronic contactor assembly, structures thereof, and methods of constructing same (2012-11-06),

12. 8278956 - Probecard system and method (2012-10-02),

13. 8268156 - Multi material secondary metallization scheme in MEMS fabrication (2012-09-18),

14. 8232818 - Probe head for a microelectronic contactor assembly, the probe head having SMT electronic components thereon (2012-07-31),

15. 8232816 - Probe head with machine mounting pads and method of forming same (2012-07-31),

Company Overview

Advantest America, Inc., based in San Jose, California, specializes in the development and manufacturing of advanced semiconductor test systems and solutions. The company focuses on providing high-performance testing equipment that supports the semiconductor industry, enabling efficient and reliable testing of integrated circuits. With a commitment to innovation, Advantest plays a crucial role in enhancing the quality and performance of electronic devices across various sectors, including telecommunications, automotive, and consumer electronics.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 6 2026

15 Patents

#418 in San Jose, CA

#5,022 in California

#21,034 in US

#39,881 in the World

San Jose, CA, United States of America

Advantest America, Inc.

Forward Citations = 32

15 inventors:

Florent Cros (5 out of 7 patents)

Yohannes Desta (4 out of 6 patents)

Matthew Losey (4 out of 4 patents)

4. Montray Leavy (3 out of 3 patents)

5. Ting Hu (3 out of 5 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Advantest America, Inc.. Retrieved from https://idiyas.com/company/advantest-america

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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