Ting Hu

Title: The Innovative Contributions of Inventor Ting Hu

Introduction

Ting Hu, located in Monrovia, CA, is a distinguished inventor with a notable portfolio of five patents. His contributions primarily focus on innovations in semiconductor testing, reflecting a commitment to enhancing the efficiency and effectiveness of electronic device testing methods.

Latest Patents

Among his latest innovations is the patent titled "Fine Pitch Probes for Semiconductor Testing, and a Method to Fabricate and Assemble Same." This invention discloses an apparatus designed for testing electronic devices, which features a plurality of probes attached to a substrate. Each probe is capable of elastic deformation upon contact with the electronic devices, providing essential adaptability during testing. The structure includes isolated electrical vertical interconnect accesses that connect the probe tips to the substrate, enabling effective electrical current conduction from the device under test. Additionally, the design incorporates a probe comb and a holder with slots for geometric alignment, allowing for simplified assembly and disassembly of the probe comb.

Career Highlights

Ting Hu has collaborated with prominent companies throughout his career, including Advantest America, Inc. and Touchdown Technologies, Inc. His work in these organizations has been instrumental in the development and refinement of advanced testing apparatuses, showcasing his expertise in the semiconductor field.

Collaborations

Throughout his professional journey, Ting has had the opportunity to work alongside talented individuals such as Melvin Khoo and Nim Tea. Their collective efforts have contributed to innovative solutions in the electronics sector, strengthening the industry’s capacity for intricate semiconductor evaluations.

Conclusion

In conclusion, Ting Hu is a remarkable inventor whose work has significantly impacted semiconductor testing methodologies. With his latest patents and collaborative efforts, he continues to enhance the technological landscape, ultimately paving the way for more efficient electronic device testing solutions.