The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2014

Filed:

Nov. 09, 2011
Applicants:

Laksmi Namburi, Baldwin Park, CA (US);

Matt Losey, Baldwin Park, CA (US);

Florent Cros, Baldwin Park, CA (US);

Inventors:

Laksmi Namburi, Baldwin Park, CA (US);

Matt Losey, Baldwin Park, CA (US);

Florent Cros, Baldwin Park, CA (US);

Assignee:

Advantest America, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 3/00 (2006.01); G01R 1/073 (2006.01); H05K 13/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06794 (2013.01); G01R 3/00 (2013.01); G01R 1/07357 (2013.01); H01L 2224/13191 (2013.01); H05K 13/0023 (2013.01); G01R 1/07314 (2013.01);
Abstract

Provided are microfabricated probe elements, including elastomer elements, and methods of making the same, that can be readily used with fine pitch microelectronic arrays, for instance by providing sufficient compliance in a small package, while minimizing deflection forces, and while precisely maintaining the planarity and positioning of the contact tips across vast grid arrays. Elastomer elements may be generated using photolithography, either directly or through a sacrificial lost-mold process. Elastomer probe elements are provided with rigid tip structures microfabricated thereon to improve contact pressure. A novel space transformation probe card assembly is also provided.


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