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Göttingen, Germany

Abberior Instruments Gmbh

USPTO Granted Patents = 33

EPO Patents = 45

Trademarks = 5

Forward Citations = 12

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16 inventors (with patents filed for the assignee):

Lars Kastrup (12 out of 15 patents)

Roman Schmidt (12 out of 12 patents)

Benjamin Harke (11 out of 12 patents)

4. Matthias Reuss (10 out of 10 patents)

5. Joachim Fischer (9 out of 10 patents)

6. Andreas Schoenle (7 out of 7 patents)

7. Matthias Henrich (7 out of 7 patents)

8. Christian Wurm (5 out of 11 patents)

9. Gerald Donnert (5 out of 8 patents)

10. Winfried Willemer (4 out of 6 patents)

11. Joern Heine (2 out of 2 patents)

12. Jörn Heine (2 out of 2 patents)

13. Haugen Mittelstaedt (1 out of 1 patent)

14. Noël MOLIÈRE (1 out of 1 patent)

15. Haugen Mittelstädt (1 out of 1 patent)

33 patents: Sort by Forward Citations

1. 12693224 - Method for localizing or tracking emitters in a sample (2026-07-28),

2. 12644838 - Method, device and non-transitory computer-readable medium for localizing individual emitters in a sample (2026-06-02),

3. 12638397 - Method for localizing and tracking emitters in a sample (2026-05-26),

4. 12631863 - Luminescence microscope for imaging a sample or for localizing or tracking emitters in a sample (2026-05-19),

5. 12601901 - Detection device for a laser scanning microscope (2026-04-14),

6. 12560791 - Method and light microscope for localizing individual emitters in a sample (2026-02-24),

7. 12554111 - Method and apparatus for correcting aberrations in fluorescence microscopy (2026-02-17),

8. 12535416 - Method, light microscope and computer program for determining a reference time point (2026-01-27),

9. 12523607 - Method and fluorescence microscope for determining the location of individual fluorescent dye molecules by means of adaptive scanning (2026-01-13),

10. 12510740 - Method and apparatus for high-resolution localization of a single emitter in multiple spatial directions (2025-12-30),

11. 12461009 - Method and microscope for recording trajectories of individual particles in a sample (2025-11-04),

12. 12352943 - Method and device for illuminating a sample in a microscope in points (2025-07-08),

13. 12306392 - Method, apparatus and computer program for localizing an emitter in a sample (2025-05-20),

14. 12265033 - Method, computer program and apparatus for determining positions of molecules in a sample (2025-04-01),

15. 12259329 - Method of disturbance correction, and laser scanning microscope having disturbance correction (2025-03-25),

Abberior Instruments is a leading manufacturer of cutting-edge, high-resolution microscopy solutions for the life sciences and materials research fields. They specialize in super-resolution microscopes that enable researchers to achieve unprecedented levels of resolution and sensitivity in their imaging studies. With a strong focus on innovation and customer satisfaction, Abberior Instruments is committed to providing the highest quality products and support to help researchers advance their scientific discoveries.

This text is generated by artificial intelligence and may not be accurate.

Company Badge

USPTO Data Jan 1 1976 - Sep 15 2026

33 Patents

#7 in Göttingen

#1,482 in Germany

#20,082 in the World

Göttingen, Germany

Abberior Instruments Gmbh

Forward Citations = 12

16 inventors:

Lars Kastrup (12 out of 15 patents)

Roman Schmidt (12 out of 12 patents)

Benjamin Harke (11 out of 12 patents)

4. Matthias Reuss (10 out of 10 patents)

5. Joachim Fischer (9 out of 10 patents)

Please report any incorrect information to [email protected]

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