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Göttingen, Germany

Abberior Instruments Gmbh

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USPTO Granted Patents = 37

EPO Patents = 46

Trademarks = 5

Forward Citations = 15

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17 inventors (with patents filed for the assignee):

Lars Kastrup (13 out of 16 patents)

Roman Schmidt (13 out of 13 patents)

Matthias Reuss (12 out of 12 patents)

4. Benjamin Harke (11 out of 12 patents)

5. Joachim Fischer (9 out of 10 patents)

6. Andreas Schoenle (7 out of 7 patents)

7. Matthias Henrich (7 out of 7 patents)

8. Christian Wurm (5 out of 11 patents)

9. Gerald Donnert (5 out of 8 patents)

10. Winfried Willemer (4 out of 6 patents)

11. Joern Heine (2 out of 2 patents)

12. Noël MOLIÈRE (2 out of 2 patents)

13. Jörn Heine (2 out of 2 patents)

14. Andreas Schönle (1 out of 4 patents)

15. Haugen Mittelstaedt (1 out of 1 patent)

Core Competencies:

Emitter Localization

Fluorescence Microscopy

High-Resolution Imaging

Aberration Correction

Laser Scanning

Adaptive Scanning

Confocality Testing

Phase Front Shaping

Trajectory Recording

Light Microscope

Computer Program

Detection Device

37 patents: Sort by Forward Citations

1. 12771356 - Sensor circuit for a device performing a safety function, device and method for processing measurement values of sensors (2026-10-20),

2. 12770415 - Light microscopy method, device and computer program product (2026-10-20),

3. 12768789 - Method for localizing or tracking emitters (2026-10-20),

4. 12768786 - Methods and device for detecting single photons from a sample comprising at least one emitter (2026-10-20),

5. 12693224 - Method for localizing or tracking emitters in a sample (2026-07-28),

6. 12644838 - Method, device and non-transitory computer-readable medium for localizing individual emitters in a sample (2026-06-02),

7. 12638397 - Method for localizing and tracking emitters in a sample (2026-05-26),

8. 12631863 - Luminescence microscope for imaging a sample or for localizing or tracking emitters in a sample (2026-05-19),

9. 12601901 - Detection device for a laser scanning microscope (2026-04-14),

10. 12560791 - Method and light microscope for localizing individual emitters in a sample (2026-02-24),

11. 12554111 - Method and apparatus for correcting aberrations in fluorescence microscopy (2026-02-17),

12. 12535416 - Method, light microscope and computer program for determining a reference time point (2026-01-27),

13. 12523607 - Method and fluorescence microscope for determining the location of individual fluorescent dye molecules by means of adaptive scanning (2026-01-13),

14. 12510740 - Method and apparatus for high-resolution localization of a single emitter in multiple spatial directions (2025-12-30),

15. 12461009 - Method and microscope for recording trajectories of individual particles in a sample (2025-11-04),

Company Overview

Abberior Instruments GmbH, based in Göttingen, Germany, specializes in advanced optical microscopy solutions. The company focuses on developing innovative imaging technologies that enhance the capabilities of fluorescence microscopy, enabling researchers to explore biological processes at unprecedented resolutions. Their products are widely utilized in life sciences, particularly in cellular and molecular biology, contributing to significant advancements in scientific research and understanding of complex biological systems.

Profile summary synthesized from public USPTO records and patent filings.

Company Badge

USPTO Data Jan 1 1976 - Oct 27 2026

37 Patents

#6 in Göttingen

#1,371 in Germany

#18,312 in the World

Göttingen, Germany

Abberior Instruments Gmbh

Forward Citations = 15

17 inventors:

Lars Kastrup (13 out of 16 patents)

Roman Schmidt (13 out of 13 patents)

Matthias Reuss (12 out of 12 patents)

4. Benjamin Harke (11 out of 12 patents)

5. Joachim Fischer (9 out of 10 patents)

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Abberior Instruments Gmbh. Retrieved from https://idiyas.com/company/abberior-instruments

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]

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