The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2026
Filed:
May. 16, 2023
Abberior Instruments Gmbh, Gottingen, DE;
Benjamin Harke, Gottingen, DE;
Lars Kastrup, Gottingen, DE;
ABBERIOR INSTRUMENTS GMBH, Gottingen, DE;
Abstract
The invention relates to a method for determining a reference time point (t) by means of a light microscope (), wherein a sample () is illuminated by first light pulses (P) in order to excite light-emitting entities in the sample (), wherein a light signal generated by means of the first light pulses (P) is detected, and wherein the reference time point (t) is determined based on the detected light signal, and wherein the light signal is detected in at least two measurements each in a first detection time window (G), wherein a starting time point of the first detection time window (G) is adjusted for each of the measurements. The invention further relates to a light microscope () and a computer program for carrying out the method.