The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2026
Filed:
Apr. 11, 2022
Abberior Instruments Gmbh, Goettingen, DE;
Abberior Instruments GmbH, Göttingen, DE;
Abstract
Scanning fluorescence microscopes and related methods are described for microscopically recording images of samples extending in three dimensions. In particular embodiments, the microscopes are configured for recording a first sectional image that is parallel to an optical axis of a microscope objective lens by scanning a sample with a focused excitation light distribution in a sectional area parallel to the optical axis of the microscope objective. The excitation light distribution may be corrected by a correction device according to initial adjustment values for adjustment parameters of an aberration correction function. The first sectional image is then evaluated and new adjustment values for the adjustment parameters are defined. Further image data are then recorded by scanning the sample with the focused excitation light distributions, with the excitation light distribution corrected by the correction device according to the new adjustment values for the adjustment parameters of the aberration correction function.