The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2026
Filed:
Aug. 08, 2024
Applicant:
Abberior Instruments Gmbh, Gottingen, DE;
Inventor:
Matthias Reuss, Gottingen, DE;
Assignee:
ABBERIOR INSTRUMENTS GMBH, Gottingen, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 21/17 (2006.01); G01N 21/47 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G01N 21/47 (2013.01); G02B 21/06 (2013.01); G01N 2021/178 (2013.01);
Abstract
The present disclosure relates to a method for localizing or tracking individual emitters in a sample according to the MINFLUX principle, wherein the sample is illuminated at several illumination positions in a close range around the emitter from different illumination directions with modulation light which comprises a linearly or flatly extended intensity minimum. A position of the emitter in the sample is calculated from the emissions of the emitter detected at the illumination positions. The invention further relates to a light microscope for carrying out the method.