The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Apr. 06, 2017
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Chun-I Tsai, Hsinchu, TW;

Chi-Yuan Chen, Hsinchu, TW;

Wei-Jung Lin, Hsinchu, TW;

Chia-Han Lai, Zhubei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 23/522 (2006.01); H01L 21/02 (2006.01); H01L 21/28 (2006.01); H01L 29/66 (2006.01); H01L 23/532 (2006.01); H01L 29/51 (2006.01); H01L 21/285 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02063 (2013.01); H01L 21/28079 (2013.01); H01L 21/76804 (2013.01); H01L 21/76814 (2013.01); H01L 21/76865 (2013.01); H01L 21/76876 (2013.01); H01L 21/76877 (2013.01); H01L 21/76879 (2013.01); H01L 23/5226 (2013.01); H01L 23/53257 (2013.01); H01L 23/53266 (2013.01); H01L 29/66545 (2013.01); H01L 21/28556 (2013.01); H01L 23/53223 (2013.01); H01L 23/53238 (2013.01); H01L 29/517 (2013.01); H01L 2924/0002 (2013.01);
Abstract

Methods of forming conductive structures and the conductive structures are disclosed. A method includes forming an opening in a dielectric layer over a substrate, performing a cleaning process on the dielectric layer with the opening, forming a nucleation layer in the opening, etching the nucleation layer in the opening, and forming a conductive material in the opening and on the nucleation layer after the etching. An upper portion of the opening is distal from the substrate, and a lower portion of the opening is proximate the substrate. After the etching, a thickness of an upper portion of the nucleation layer in the upper portion of the opening is less than a thickness of a lower portion of the nucleation layer in the lower portion of the opening.


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