The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2018

Filed:

Oct. 26, 2016
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Seiyon Kim, Portland, OR (US);

Daniel A. Simon, Hillsboro, OR (US);

Nadia M. Rahhal-Orabi, Hillsboro, OR (US);

Chul-Hyun Lim, Portland, OR (US);

Kelin J. Kuhn, Aloha, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/775 (2006.01); H01L 29/786 (2006.01); H01L 27/088 (2006.01); H01L 29/06 (2006.01); H01L 21/02 (2006.01); H01L 29/66 (2006.01); H01L 29/161 (2006.01); H01L 29/423 (2006.01); H01L 29/78 (2006.01); H01L 21/8238 (2006.01); B82Y 10/00 (2011.01); H01L 27/092 (2006.01); H01L 29/165 (2006.01);
U.S. Cl.
CPC ...
H01L 29/78696 (2013.01); B82Y 10/00 (2013.01); H01L 21/02603 (2013.01); H01L 21/823807 (2013.01); H01L 27/0886 (2013.01); H01L 29/0649 (2013.01); H01L 29/0669 (2013.01); H01L 29/0673 (2013.01); H01L 29/161 (2013.01); H01L 29/42392 (2013.01); H01L 29/6653 (2013.01); H01L 29/6656 (2013.01); H01L 29/66439 (2013.01); H01L 29/66545 (2013.01); H01L 29/66553 (2013.01); H01L 29/66742 (2013.01); H01L 29/66795 (2013.01); H01L 29/775 (2013.01); H01L 29/785 (2013.01); H01L 29/78618 (2013.01); H01L 29/78651 (2013.01); H01L 29/78684 (2013.01); H01L 27/092 (2013.01); H01L 29/165 (2013.01);
Abstract

A nanowire transistor of the present description may be produced with internal spacers formed by using sacrificial spacers during the fabrication thereof. Once the nanowire transistor is formed, the sacrificial spacers, which are position between the transistor gate and the source and drains (respectively), may be removed. The sacrificial material between channel nanowires of the nanowire transistor may then be removed and a dielectric material may be deposited to fill the spaces between the channel nanowires. The dielectric material not between the channel nanowires may be removed to form the internal spacers. External spacers, which are position between the transistor gate and the source and drains (respectively), may then be formed adjacent the internal spacers and transistor channel nanowires.


Find Patent Forward Citations

Loading…