The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2017

Filed:

Jan. 17, 2017
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;

Inventors:

Shen-Nan Lee, Jhudong Township, TW;

Teng-Chun Tsai, Hsinchu, TW;

Hsin-Hsien Lu, Hsinchu, TW;

Chang-Sheng Lin, Baoshan Township, TW;

Kuo-Cheng Lien, Hsinchu, TW;

Kuo-Yin Lin, Jhubei, TW;

Wen-Kuei Liu, Xinpu Township, TW;

Yu-Wei Chou, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 21/66 (2006.01); H01L 21/67 (2006.01); B24B 7/22 (2006.01); B24B 9/06 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0209 (2013.01); B24B 7/228 (2013.01); B24B 9/065 (2013.01); H01L 21/02087 (2013.01); H01L 21/02096 (2013.01); H01L 21/67092 (2013.01); H01L 21/67288 (2013.01); H01L 22/20 (2013.01); H01L 21/02043 (2013.01); H01L 21/02057 (2013.01);
Abstract

Some embodiments are directed to a wafer polishing tool. The wafer polishing tool includes a first polisher, a second polisher downstream of the first polisher, a third polisher downstream of the second polisher, and a fourth polisher downstream of the third polisher. The first polisher receives a wafer having a front side and a back side with integrated circuit component devices disposed on the front side of the wafer, and polishes a center region on the back side of the wafer. The second polisher receives the wafer via transporting equipment and buffs the center region of the back side of the wafer. The third polisher receives the wafer via the transporting equipment and polishes a back side edge region of the wafer. The fourth polisher receives the wafer via the transporting equipment and buffs the back side edge region of the wafer.


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